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Influence of atomic force microscope (AFM) probe shape on adhesion force measured in humidity environment*
  • ISSN号:0253-4827
  • 期刊名称:《应用数学和力学:英文版》
  • 时间:0
  • 分类:O343[理学—固体力学;理学—力学]
  • 作者机构:[1]College of Physics Science and Technology, Guangxi Normal University, Guilin 541004, Guangxi Province, P. R. China, [2]Institute of Systems Biology, Shanghai University, Shanghai 200444, P. R. China
  • 相关基金:Project supported by the National Natural Science Foundation of China (Nos. 11105088 and 81060307), the Innovation Program of Shanghai Municipal Education Commission (No. 11YZ20), the Guangxi Natural Science Foundation Program (No. 2013GXNSFBA019006), and the Guangxi Province Higher Educational Science and Technology Program (No. 2013YB033)
中文摘要:

In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope(AFM) tips and substrate.The analysis shows that the precise tip geometry plays a critical role on humidity dependence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt(paraboloid) tip, the adhesion force versus humidity curves tends to the apparent contrast(peak-to-valley corrugation) with a broad range.This paper demonstrates that the abrupt change of the adhesion force has high correlation with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines(triple point) on the probe profiles. The study provides insights for further understanding nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments.

英文摘要:

In micro-manipulation, the adhesion force has very important influence on behaviors of micro-objects. Here, a theoretical study on the effects of humidity on the adhesion force is presented between atomic force microscope (AFM) tips and substrate. The analysis shows that the precise tip geometry plays a critical role on humidity depen- dence of the adhesion force, which is the dominant factor in manipulating micro-objects in AFM experiments. For a blunt (paraboloid) tip, the adhesion force versus humidity curves tends to the apparent contrast (peak-to-valley corrugation) with a broad range. This paper demonstrates that the abrupt change of the adhesion force has high correla- tion with probe curvatures, which is mediated by coordinates of solid-liquid-vapor contact lines (triple point) on the probe profiles. The study provides insights for further under- standing nanoscale adhesion forces and the way to choose probe shapes in manipulating micro-objects in AFM experiments.

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期刊信息
  • 《应用数学和力学:英文版》
  • 主管单位:交通部
  • 主办单位:上海大学
  • 主编:周哲玮
  • 地址:上海市宝山区上大路99号上海大学122信箱
  • 邮编:200444
  • 邮箱:amm@department.shu.edu.cn
  • 电话:021-66135219 66165601
  • 国际标准刊号:ISSN:0253-4827
  • 国内统一刊号:ISSN:31-1650/O1
  • 邮发代号:
  • 获奖情况:
  • 上海市优秀科技期刊一等奖,中国期刊方阵“双效”期刊
  • 国内外数据库收录:
  • 美国数学评论(网络版),波兰哥白尼索引,德国数学文摘,荷兰文摘与引文数据库,美国工程索引,美国科学引文索引(扩展库),英国科学文摘数据库,日本日本科学技术振兴机构数据库,美国应用力学评论
  • 被引量:541