中文摘要：

通过实例分析，指出对于同一胚胎电子系统，当活动节点的数量一定时，活动节点阵列的行列结构不同会带来不同的可靠性；然后针对具有n×n阵列的胚胎电子系统，采用k-out—of-m可靠性模型，分别在行取消和细胞取消两种错误恢复策略下，从理论和实验上分析了不同行列结构对活动节点阵列可靠性的影响，并给出优化的活动节点阵列设计准则．

英文摘要：

Through analysis of instances, a question was proposed that the same embryonic array with different active node arrays would result in different reliabilities when the total number of active nodes was fixed. Then, aiming at the n ＊ n embryonic array system and using the k-out-of-m reliability model, the reliability effect of the active node arrays was analyzed theoretically and experimentally when the structures were different and rules for optimal active node arrays design were proposed. The analyses were respectively based on row elimination and cell elimination fault-recovery strategies.