中文摘要：

[SiO ₂/FePt]₅/Ag 薄电影被 RF 磁控管在在真空为 30 min 在 550 ° C 退火的玻璃底层和柱子上劈啪作响扔。颤动的样品磁强计和 X 光检查衍射分析器被使用学习这些电影的磁性和微观结构。没有 Ag underlayer，结果显示出那[扔到玻璃上的 SiO ₂/FePt]₅ 电影是 FCC 混乱；与 Ag underlayer 的增加[SiO ₂/FePt]₅/Ag 电影被变成 L1 ₀ 并且(111 ) 混合了质地。SiO ₂ 的变化无磁性的层厚度在[SiO ₂/FePt]₅/Ag 电影显示 SiO ₂-doping 在改进顺序参数和垂直磁性的 anisotropy，并且减少谷物尺寸起一个重要作用并且内部谷物相互作用。由控制 SiO ₂厚度，高度垂直的磁性的 anisotropy 能被获得在[ SiO ₂( 0.6 nm ) /FePt ( 3 nm )] 5/Ag ( 50 nm )拍摄并且( 001 )高度，面向的电影能被获得在[ SiO ₂( 2 nm ) /FePt ( 3 nm )] ₅/Ag ( 50 nm )拍摄。

英文摘要：

[SiO2/FePt]5/Ag thin films were deposited by RF magnetron sputtering on the glass substrates and post annealing at 550 ℃ for 30 min in vacuum. Vibrating sample magnetometer and X-ray diffraction analyser were applied to study the magnetic properties and microstructures of the films. The results show that without Ag underlayer [SiO2/FePt]5 films deposited onto the glass are FCC disordered; with the addition of Ag underlayer [SiO]FePt]5/Ag films are changed into L10 and （111） mixed texture. The variation of the SiO2 nonmagnetic layer thickness in [SiO2/FePt]5/Ag films indicates that SiO2-doping plays an important role in improving the order parameter and the perpendicular magnetic anisotropy, and reducing the grain size and intergrain interactions. By controlling SiO2 thickness the highly perpendicular magnetic anisotropy can be obtained in the [SiO2 （0.6 nm）/FePt （3 nm）]5/Ag （50 nm） films and highly （001）-oriented films can be obtained in the [SiO2 （2 nm）/FePt （3 nm）]5/Ag （50 nm） films.