内在的表面反应常数, pKinta1, pKinta2, p *KintC 和 p *KintA,没有结构的充电和 Mg-Fe 象 hydrotalcite 一样混合物(HTlc ) ,被修改双推测(MDE ) 分别地与结构的充电为 TiO2 评估。为 TiO2 的常数与班获得的那些相比的内在的表面反应的结果在文学加倍推测(CDE ) 。而且, MDE 获得的内在的表面反应常数的价值被用来模仿材料的收费行为。下列结论被获得。为没有结构的充电的 TiO2, MDE 评估的 pKinta1 和 pKinta2 等于由 CDE 的那些,然而, p *KintC 和 p *KintA 由 MDE 评估了与由 CDE 的那些不同。原则上, *KintC 和 p *KintA 由 MDE 评估了的 p 的结果是比由 CDE 的那些更精确的。MDE 获得的内在的表面反应常数的价值能最优地与三倍的层模型(TLM ) 一起为 TiO2 模仿收费曲线。为有积极结构的充电的 HTlc, *KintC =0 和 *KintA 的结果被 MDE 获得,它意味着惰性的电解质化学药品绑定不存在;c独立的零网费用( PZNC )的点没有结构的充电,也作为与固体一样存在,并且酸硷的滴定获得的 pHPZNC 能最优地被模仿,控告趋势的表面能用 MDE 和弥漫的层模型( DLM )评估的 pKinta1 和 pKinta2 在很大程度上被模仿。
The intrinsic surface reaction constants, pKa1^int, pKa2^int, p^*KC^int and p^*KA^int , were evaluated by a modifieddouble extrapolation (MDE) for TiO2 without structural charge and Mg-Fe hydrotalcite-like compounds (HTlc) with structural charge, respectively. The results of intrinsic surface reaction constants for TiO2 were compared with those obtained by class double extrapolation (CDE) in literature. Furthermore, the values of intrinsic surface reaction constants obtained by MDE were used to simulate the charging behaviors of the materials. The following conclusions were obtained. For TiO2 without structural charge, the pKa1^int and pKa2^int evaluated by MDE are equal to those by CDE, however the p^*KC^int and p^*KA^int evaluated by MDE are much different from those by CDE. In principle, the results of the p^*KC^int and p^*KA^int evaluated by MDE are more accurate than those by CDE. The values of intrinsic surface reaction constants obtained by MDE can excellently simulate the charging curves for TiO2 with the triple layer model (TLM). For HTlc with positive structural charge, the results of ^*KC^int=0 and ^*KA^int →∞ were obtained by MDE, which means the inert electrolyte chemical binding does not exist; the point of zero net charge (PZNC) of c-independence also exist as the same as solid without structural charge, and the PHPZNC obtained by the acid-base titration can excellently be simulated and the surface charging tendency can be simulated to a great extent using the pKa1^int and pKa2^int evaluated by MDE and the diffuse layer model (DLM).