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Defects in CdMnTe crystals for nuclear detector applications
  • ISSN号：1674-4926
  • 期刊名称：Chinese Journal of Semiconductors
  • 时间：2013
  • 页码：1674-4926
  • 分类：O77[理学—晶体学] TN304.26[电子电信—物理电子学]
  • 作者机构：[1]State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, NorthwesternPolytechnical University, Xi'an 710072, China
  • 相关基金：Project supported by the National Natural Science Foundations of China （Nos. 50902113, 50902114, 61274081）, the National Basic Research Program of China （No. 2011CB610406）, the 111 Project of China （No. B08040）, the Specialized Research Fund for the Doctoral Program of Higher Education of China （No. 20116102120014）, NPU Foundation for Fundamental Research （No. JC20100228）, and the Research Fund of the State Key Laboratory of Solidification Processing, China （No. SKLSP201012）.
  • 相关项目：II-VI族Te化物半导体中富Te相及其诱导缺陷的调控研究
作者： Du Yuanyuan|Jie Wanqi|Xu Yadong|, Zheng Xin, Wang Tao|
关键词： CDMNTE, 晶体缺陷, 核探测器, 场发射扫描电子显微镜, 激光扫描共聚焦显微镜, 应用, FE-SEM, 检测性能, CdMnTe, twin boundary, Te inclusions, dislocations, detector response
中文摘要：

<正>A laser scanning confocal microscope(LSCM) and a field-emission scanning electron microscope(FESEM) were used to study the defects in CdMnTe crystals,such as twin boundaries,Te inclusions,and dislocations. Twin boundaries were usually decorated with Te inclusions,which could induce dislocations.The optical,electrical properties and detector performance of CdMnTe crystals with twins and free of twins were compared.The results showed that the wafers with a high density of twins usually had lower average IR transmittance and poorer crystalline quality.Besides,the energy spectra indicated that twin boundaries in a CdMnTe detector had a negative effect on detector performance;the values of both the energy resolution and(μτ)_e were nearly half of those for a single crystal detector.

英文摘要：

A laser scanning confocal microscope （LSCM） and a field-emission scanning electron microscope （FE- SEM） were used to study the defects in CdMnTe crystals, such as twin boundaries, Te inclusions, and dislocations. Twin boundaries were usually decorated with Te inclusions, which could induce dislocations. The optical, elec- trical properties and detector performance of CdMnTe crystals with twins and free of twins were compared. The results showed that the wafers with a high density of twins usually had lower average IR transmittance and poorer crystalline quality. Besides, the energy spectra indicated that twin boundaries in a CdMnTe detector had a negative effect on detector performance; the values of both the energy resolution and （μτ）e were nearly half of those for a single crystal detector.

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II-VI族Te化物半导体中富Te相及其诱导缺陷的调控研究
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期刊信息
  • 《半导体学报：英文版》
  • 中国科技核心期刊
  • 主管单位:中国科学院
  • 主办单位:中国电子学会 中国科学院半导体研究所
  • 主编：李树深
  • 地址：北京912信箱
  • 邮编：100083
  • 邮箱：cjs@semi.ac.cn
  • 电话：010-82304277
  • 国际标准刊号：ISSN：1674-4926
  • 国内统一刊号：ISSN：11-5781/TN
  • 邮发代号:2-184
  • 获奖情况:
  • 90年获中科院优秀期刊二等奖,92年获国家科委、中共中央宣传部和国家新闻出版署...,97年国家科委、中共中央中宣传部和国家新出版署三等奖,中国期刊方阵“双效”期刊
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  • 被引量:7754