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一种全偏振参数的显微测量系统
  • 期刊名称:光电工程
  • 时间:0
  • 页码:41-45
  • 语言:中文
  • 分类:TN29[电子电信—物理电子学]
  • 作者机构:[1]浙江大学微电子与光电子研究所,杭州310027
  • 相关基金:国家自然科学基金资助项目(60808035)
  • 相关项目:基于电光调制技术的偏振遥感V分量测量研究
中文摘要:

本文设计了一种用于Mueller矩阵测量的全偏振参数显微镜测量系统。该测量系统以液晶调制器键合于偏振分束棱镜表面的模块为核心器件,实现了以10次光强获取为周期的Mueller矩阵参数测量功能,能够方便地实现Mueller矩阵中全部参数图像的实时测量,比前人设计系统的测量效率有很大提高。基于该系统,本文进行了Mueller矩阵快速调制测量方案的具体设计,并给出了测量结果。论文还对该系统进行了测量误差的分析,实验结果及误差分析表明,系统的相对测量误差能够控制在2%以内。

英文摘要:

A polarizing measurement system is designed which could acquire Mueller matrix of the target cells. The system utilizes a liquid crystal modulator bonding with polarization splitter prism as its key component, to realize Mueller matrix measurement with a period of 10-time light intensity. This method can easily acquire real-time data divided from Mueller matrix, which is more efficient than other method. Besides the specific design and the experiment result are presented based on this system. The analysis and discussion of measurement error are also included, which indicates that this system's error can be controlled within 2%.

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