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On the configuration- and frequency-dependent linearity characteristics of SiGe HBTs under different
  • ISSN号：0026-2714
  • 期刊名称：Microelectronics Reliability
  • 时间：2013.3.3
  • 页码：409-413
  • 相关项目：超高速柔性单晶硅电子器件及多功能电路的研究
作者： Qin, Guoxuan|Wang, Guogong|Jiang, Ningyue|Ma, Jianguo|Ma, Zhenqiang|
同期刊论文项目
超高速柔性单晶硅电子器件及多功能电路的研究
期刊论文 25 会议论文 2 专利 2
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