提出一种实用的光电振荡器的相位噪声测量系统和新的系统参数校准方法。该测量系统和校准方法所需器件少,成本低,可测量各种结构的光电振荡器。实验结果与理论分析取得良好的一致性。
A practical system and a new system calibration method has been proposed to measurethe phase noise performance for optoelectronic oscillators(OEO). It is advantageous to use the method because of its low cost, fewer devices that required and the capability of measuring various optoelectronic oscillators with differ- ent structures. The experimental results and the theoretical analysis has good consistency.