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Scheduling stochastic job shop subject to random breakdown to minimize makespan
  • ISSN号：0268-3768
  • 期刊名称：International Journal of Advanced Manufacturing Te
  • 时间：0
  • 页码：1183-1192
  • 相关项目：产能约束下集成电路芯片多阶段测试系统优化调度的模型与方法研究
作者： Lei, Deming|
同期刊论文项目
产能约束下集成电路芯片多阶段测试系统优化调度的模型与方法研究
期刊论文 11 会议论文 7 著作 1
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