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不同掺杂量对水热合成Zn1-xNixO稀磁半导体粉体的影响
  • 期刊名称:人工晶体学报. 2008, 37 (4): 293- 296
  • 时间:0
  • 分类:TN304[电子电信—物理电子学]
  • 作者机构:[1]陕西科技大学材料科学与工程学院,西安710021, [2]陕西宝光集团,宝鸡721304
  • 相关基金:国家自然科学基金资助项目(No.50672055)
  • 相关项目:基于液相反应自组装制备透明柔性功能陶瓷薄膜及其生长机理的研究
中文摘要:

本文主要考虑不同掺杂量对水热合成Zn1-xNixO稀磁半导体粉体的影响。采用水热法,以3 mol/L NaOH作为矿化剂,在240℃下,保温24 h左右,进行Ni掺杂(x=0.05,0.1,0.2),合成Zn1-xNixO稀磁半导体晶体。XRD、FE-SEM测试表征晶体的物相组成和晶体形貌,XRD表明所制备的Zn0.95Ni0.05O稀磁半导体晶体发育比较完整。通过UV-vis测试进一步说明掺杂的效果。VSM测试表明,所制备的样品在室温下有良好的磁滞回线,表现出铁磁性。

英文摘要:

Zn1-xNixO diluted magnetic semiconductor was prepared by hydrothermal method at 240℃ for about 24 h with x =0.05-0.2. NaOH of 3 moL/L were used as the mineralizer. XRD and UV-vis were employed to demonstrate the presence of Ni ions in substitution of Zn sites. XRD analysis indicates that the as-prepared Zn0.95 Ni0.05O has the pure ZnO wurtzite structure. Optical measurements demonstrate the presence of Ni2 + in substitution of Zn2 +. Room temperature VSM reveals a ferromagnetic behavior of the Ni-doped ZnO samples and its repeatability is very good.

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