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A high voltage silicon-on-insulator lateral insulated gate bipolar transistor with a reduced cell-pi
ISSN号:1674-1056
期刊名称:Chinese Physics B
时间:2013.2
页码:-
相关项目:高压、超低功耗的易集成SOI功率器件机理与新结构研究
作者:
Wang Qi|Yao Guo-Liang|Wang Yuan-Gang|Zhou Kun|
同期刊论文项目
高压、超低功耗的易集成SOI功率器件机理与新结构研究
期刊论文 37
会议论文 4
获奖 6
同项目期刊论文
A low on-resistance triple RESURF SOI LDMOS with planar and trench gate integration
A new analytical model for the surface electric field distribution and breakdown voltage of the SOI
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A Low Specific on-Resistance SOI Trench MOSFET with a Non-Depleted Embedded p-Island
A High Figure-of-Merit SOI MOSFET with a Double-Sided Charge Oxide-Trench
High-voltage super-junction lateral double-diffused metal oxide semiconductor with a partial lightly
A low on-resistance SOI LDMOS using a trench gate and a recessed drain
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Ultra-low specific on-resistance vertical double-diffused metal-oxide semiconductor with a high-k di
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Experimental and theoretical study of an improved breakdown voltage SOI LDMOSwith a reduced cell pit
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复合沟道氟离子增强型AlGaN/GaN HEMT的研究
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A low specific on-resistance SOI MOSFET with dual gates and recessed drain
A novel high figure-of-merit SOI SJ LDMOS with ultra-strong charge accumulation effect
Ultralow specific on-resistance high voltage trench SOI LDMOS with enhanced RESURF effect
Analytical Model and New Structure of the Variable- k Dielectric Trench VDMOS With Improved Breakdow
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High voltage SOI LDMOS with a compound buried layer
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A high voltage Bi-CMOS compatible buffer super-junction LDMOS with an N-type buried layer
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Experimental and theoretical study of an improved breakdown voltage SOI LDMOS with a reduced cell pitch*
期刊信息
《中国物理B:英文版》
中国科技核心期刊
主管单位:中国科学院
主办单位:中国物理学会和中国科学院物理研究所
主编:欧阳钟灿
地址:北京 中关村 中国科学院物理研究所内
邮编:100080
邮箱:
电话:010-82649026 82649519
国际标准刊号:ISSN:1674-1056
国内统一刊号:ISSN:11-5639/O4
邮发代号:
获奖情况:
国内外数据库收录:
被引量:406