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Anomalous Resistivity in Vanadium-Doped Semi-Insulating 4H-SiC Wafers
  • ISSN号:1006-7191
  • 期刊名称:《金属学报:英文版》
  • 时间:0
  • 分类:TN304.23[电子电信—物理电子学] TN304.24[电子电信—物理电子学]
  • 作者机构:[1]stateKeyLaboratoryofCrystalMaterials,ShandongUniversity,Jinan250100,China, [2]SchoolofPhysics,ShandongUniversity,Jinan250100,China, [3]shandongInspurHuaguangOptoclectronicsCo.,Ltd,Jinan250100,China
  • 相关基金:Project supported by the National Basic Research Program of China (Grant No. 2011CB301904) and the National Natural Science Foundation of China (Grant Nos. 11134006 and 61327808).
中文摘要:

The influence of buffer layer growth conditions on the crystal quality and residual stress of GaN film grown on silicon carbide substrate is investigated.It is found that the Al GaN nucleation layer with high growth temperature can efficiently decrease the dislocation density and stress of the GaN film compared with Al N buffer layer.To increase the light extraction efficiency of GaN-based LEDs on Si C substrate,flip-chip structure and thin film flip-chip structure were designed and optimized.The fabricated blue LED had a maximum wall-plug efficiency of 72% at 80 m A.At 350 m A,the output power,the Vf,the dominant wavelength,and the wall-plug efficiency of the blue LED were 644 m W,2.95 V,460 nm,and 63%,respectively.

英文摘要:

The influence of buffer layer growth conditions on the crystal quality and residual stress of GaN film grown on silicon carbide substrate is investigated. It is found that the A1GaN nucleation layer with high growth temperature can efficiently decrease the dislocation density and stress of the GaN film compared with A1N buffer layer. To increase the light extraction efficiency of GaN-based LEDs on SiC substrate, flip-chip structure and thin film flip-chip structure were designed and optimized. The fabricated blue LED had a maximum wall-plug efficiency of 72% at 80 mA. At 350 mA, the output power, the Vf, the dominant wavelength, and the wall-plug efficiency of the blue LED were 644 roW, 2.95 V, 460 nm, and 63%, respectively.

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期刊信息
  • 《金属学报:英文版》
  • 中国科技核心期刊
  • 主管单位:中国科协
  • 主办单位:中国金属学会
  • 主编:
  • 地址:沈阳文华路72号
  • 邮编:110016
  • 邮箱:jsxb@imr.ac.cn
  • 电话:024-23971286
  • 国际标准刊号:ISSN:1006-7191
  • 国内统一刊号:ISSN:21-1361/TG
  • 邮发代号:
  • 获奖情况:
  • 国内外数据库收录:
  • 被引量:286