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硫系相变材料Ge1Sb2Te4和Ge2Sb2Te5薄膜相变速度及电学输运性质研究
ISSN号:1000-3819
期刊名称:《固体电子学研究与进展》
时间:0
分类:TN364.2[电子电信—物理电子学] O657.33[理学—分析化学;理学—化学]
作者机构:[1]State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
相关基金:Project supported by the National Natural Science Foundation of China (Grant Nos. 61036001, 51072194, and 60906035).
作者:
刘文强[1], 仝亮[1], 徐岭[1], 刘妮[1], 杨菲[1], 廖远宝[1], 刘东[1], 徐骏[1], 马忠元[1], 陈坤基[1]
关键词:
傅里叶变换红外光谱, PIN结构, 绝缘体上硅, 硅材料, 钛掺杂, 太阳能电池, SOI衬底, FTIR, infrared response, ion implantation, rapid thermal annealing, intermediate band solarcell
中文摘要:
Corresponding author. E-maih yhzuo@semi.ac.cn
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相变存储材料Ge1Sb2Te4和Ge2Sb2Te5薄膜的结构和电学特性研究
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相变存储材料Ge1Sb2Te4和Ge2Sb2Te5薄膜的结构和电学特性研究
相变存储材料Ge1Sb2Te4和Ge2Sb2Te5薄膜的结构和电学特性研究
期刊信息
《固体电子学研究与进展》
中国科技核心期刊
主管单位:中国电子科技集团公司
主办单位:南京电子器件研究所
主编:杨乃彬
地址:南京中山东路524号(南京160信箱43分箱)
邮编:210016
邮箱:gtdz@chinajournal.net.cn
电话:025-86858161
国际标准刊号:ISSN:1000-3819
国内统一刊号:ISSN:32-1110/TN
邮发代号:
获奖情况:
中国期刊方阵双效期刊,江苏省第六届优秀期刊,工信部09-10年期刊编辑质量优秀奖
国内外数据库收录:
美国化学文摘(网络版),荷兰文摘与引文数据库,中国中国科技核心期刊,中国北大核心期刊(2008版),中国北大核心期刊(2011版),中国北大核心期刊(2014版),中国北大核心期刊(2000版)
被引量:2461