中文摘要：

编码方法通过压缩原始测试数据达到减少测试数据量的目的,是解决集成电路测试过程中测试数据量快速增长的有效方法之一。提出一种新的长度折半的测试数据编码方法,该方法首先对测试数据同时按0游程和1游程进行划分,然后对划分进行长度折半,编码。该方法既减少了编码的游程数量,又减少了编码的游程长度,可以在不增加代码长度的情况下增加能编码的游程长度。理论分析证明该方法具有极高的压缩效率,同时该方法解压结构简单,且独立于测试数据。实验结果表明：该方法平均压缩率达到65.13%。因此该方法具有很高的性价比,具有一定的应用价值。

英文摘要：

The encoding method is one of the effective methods to solve the rapid growth of the amount of test data in the process of integrated circuit test. It can reduce test data volume by compressing the original test data. A test resource encoding method based on length halving put forward. The test data is divided into partitions one by one according to 0 run length and 1 run length at the same time,then a new length is gotten by halving the length of the partition. Finally,the code word is gotten by encoding the new length. This method not only reduces the amount of run length,but also reduces the length of encoding run. The encoding run length could increase without increasing the length of the code word. Theoretical analysis shows that this method has high compression efficiency,at the same time the decoding method has the advantages of simple structure and independent of the test data. According to the experimental results,the average compression ratio is 65. 13%. Therefore,this method has high performance price ratio and certain application value.