中文摘要：

通过减少测试数据来减少测试成本是集成电路测试领域的热点之一。文章综述了测试数据减少技术，分析了每一种技术的优缺点，指出了该技术的发展需求和方向。

英文摘要：

It is a very topic to reduce the test cost by reducing the test data in integrated circuit testing. Firstly test reduction techniques are categorized, and the advantages of each technic are analyzed. Then, its demand and the trend of development are pointed out.