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Temperature Dependence of Microwave Dielectric Performance of Silica
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  • 分类:TM26[电气工程—电工理论与新技术;一般工业技术—材料科学与工程]
  • 作者机构:[1]电子科技大学电子薄膜与集成器件国家重点实验室,四川成都610054
  • 相关基金:国家自然科学基金资助项目(No.50902017)
中文摘要:

采用金属有机沉积(MOD)法在LaAlO3(LAO)单晶基片上沉积了LaMnO3(LMO)缓冲层薄膜,通过控制LMO薄膜关键生长工艺(如退火温度、退火时间),系统地研究了薄膜微结构的变化。实验表明:在较宽的退火温度窗口范围均能获得单一取向生长的LMO薄膜,但其面外织构特性爱退火温度和退火时间的影响很大。在退火温度为750℃,退火时间为60min的最优工艺条件下,制备的LMO缓冲层具有纯C轴取向。在该LMO缓冲层上沉积的YBa2Cu30h(YBCO)超导薄膜的临界电流密度为1.0×10^6A/cm^2,成功证明MOD法制备LMO缓冲层的可行性。

英文摘要:

The growth of LaMnO3 films on (001) LaAIO3 (LAO) single crystal substrates via the metal-organic decomposition (MOD) method under different growth crafts such as annealing temperature and time was systematically investigated. The results show that single-oriented LMO films are obtained at a wide annealing-temperature range, while out-of-plane texture is greatly influenced by annealing temperature and time. Purely c-axis oriented LMO films are successfully deposited under the best annealing process parameters (750 ℃, 60 min). The YBa2Cu307-x (YBCO) superconducting film grown on the best LMO film exhibits a critical current density of 1.0xl06 A/cm2, demonstrating the feasibility of epitaxial growth of LMO buffer layers for coated conductors based on MOD method.

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