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Theoretical modification of the negative Miller capacitance during the switching transients of IGBTs
  • ISSN号:1674-4926
  • 期刊名称:《半导体学报:英文版》
  • 时间:0
  • 分类:TN322.8[电子电信—物理电子学] TN710[电子电信—电路与系统]
  • 作者机构:Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
  • 相关基金:Project supported by the National Major Science and Technology Special Project (No. 2013ZX02305005-002), and the National Natural Science Foundation Major Program (No. 51490681).
中文摘要:

The insulated gate bipolar transistor(IGBT) has negative Miller capacitance during switching transients.It has conventionally been attributed to the voltage dependency of the Miller capacitance.However this explanation has physical ambiguity,yet,it lacks a discussion of the conditions for the occurrence of negative Miller capacitance as well.We argue that it is the current dependence to the Miller capacitance that results in the negative case.In this paper,we provide a modification to the theoretical analysis of this phenomenon.The occurrence condition for it and the device parameters about it are discussed.It is discovered that the negative Miller capacitance must occur during the turn-off process for any IGBT,while it is relatively difficult during the turn-on process.At the device design level,the current gain of the PNP transistor in the IGBT is an important factor for the negative Miller capacitance.

英文摘要:

The insulated gate bipolar transistor (1GBT) has negative Miller capacitance during switching transients. It has conventionally been attributed to the voltage dependency of the Miller capacitance. However this explanation has physical ambiguity, yet, it lacks a discussion of the conditions for the occurrence of negative Miller capacitance as well. We argue that it is the current dependence to the Miller capacitance that results in the negative case. In this paper, we provide a modification to the theoretical analysis of this phenomenon. The occurrence condition for it and the device parameters about it are discussed. It is discovered that the negative Miller capacitance must occur during the turn-off process for any IGBT, while it is relatively difficult during the turn-on process. At the device design level, the current gain of the PNP transistor in the IGBT is an important factor for the negative Miller capacitance.

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期刊信息
  • 《半导体学报:英文版》
  • 中国科技核心期刊
  • 主管单位:中国科学院
  • 主办单位:中国电子学会 中国科学院半导体研究所
  • 主编:李树深
  • 地址:北京912信箱
  • 邮编:100083
  • 邮箱:cjs@semi.ac.cn
  • 电话:010-82304277
  • 国际标准刊号:ISSN:1674-4926
  • 国内统一刊号:ISSN:11-5781/TN
  • 邮发代号:2-184
  • 获奖情况:
  • 90年获中科院优秀期刊二等奖,92年获国家科委、中共中央宣传部和国家新闻出版署...,97年国家科委、中共中央中宣传部和国家新出版署三等奖,中国期刊方阵“双效”期刊
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  • 被引量:7754