中文摘要：

e-mail： xiexuan@ueste.edu.cn,Xuan Xie received the M.S. and Ph.D. degrees from University of Electronic Science and Technology of China （UESTC）, Chengdu, China in 2009 and 2016, respectively. She is currently working with UESTC. Her research interests include signal processing, fault diagnosis, and information theory. Xi-Feng Li received the B.S., M.S., and Ph.D. degrees from UESTC in 2005, 2008, and 2014, respectively. He has been a visiting scholar at Arizona State University, USA for one year. He works as a lecturer with the School of Automation Engineering, UESTC. His research interests include the design for testability, fault diagnosis, and fault prognosis. Qi-Zhong Zhou received the B.S., M.S., and Ph.D. degrees from UESTC in 2001, 2004, and 2016, respectively. He is currently working with Yibin University as a professor. His research interests include IC design, fault diagnosis, and signal processing. yonglexie@126.com,（corresponding author）,Yong-Le Xie received the B.S. degree from Zhejiang University, Hangzhou, China in 1985 and the M.S. and Ph.D. degrees from UESTC in 1988 and 2002, respectively. Since 1988, he has been working with UESTC and is currently a professor with the School of Automation Engineering, UESTC. His research interests include the diagnosis of complicated electronic systems and testability analysis.