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Characteriztion of silicon wafers with combined photocarrier radiometry and free carrier absorption
  • ISSN号：0195-928X
  • 期刊名称：International Journal of Thermophysics
  • 时间：2013.9.9
  • 页码：1735-1745
  • 相关项目：超浅结特性的光学无损检测技术研究
作者： Li Bincheng|Huang Qiuping|Ren Shengdong|
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