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Influence of source and drain contacts on the properties of the indium-zinc oxide thin-film transist
  • ISSN号：0021-8979
  • 期刊名称：Journal of Applied Physics
  • 时间：2011.11.15
  • 页码：-
  • 相关项目：金属氧化物薄膜晶体管稳定性机理的研究
作者： Zou, Jianhua|Tao, Hong|Wang, Lei|Yao, Rihui|
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金属氧化物薄膜晶体管稳定性机理的研究
期刊论文 45
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