中文摘要：

采用四倍频的Nd：YAG脉冲激光（波长266nm，脉宽10ns，脉冲能量密度300mJ／cm^2）对PbO摩尔分数在0．3～0．66的硅酸铅玻璃体样品进行照射，并对照射前后样品的X射线光电子能谱（XPS）进行了测量。研究发现266nm激光照射前后Pb4f和Si2p的结合能没有变化，说明Pb和Si元素的价态没有发生改变；但X射线光电子能蔷图上这两个峰的高度却有明显的变化：Pb4f峰增高而Si2p峰减小，说明硅酸铅玻璃受266nm紫外激光照射后表面结构发生变化，PbO含量增大而SiO2含量减少。

英文摘要：

The X-ray photoelectron spectroscopy （XPS） for the lead silicate glasses with different lead concentration （mole fraction of PbO change from 0. 3 to 0. 66） was measured before and after irradiation with frequencyquadrupled output of a Q-switched NdzYAG laser （wavelength 266 nm, repetition rate 10 Hz, pulse energy density 300 mJ/cm^2）. The combination energies of Pb 4f and Si 2p have no change after ultraviolet （UV） laser irradiation. This shows that the covalent states of Pb and Si have no change. But the peak strength of Pb 4f and Si 2p changes evidently on the X-ray photoelectron spectroscopy： the strength of Pb 4f increases and the strength of Si 2p decreases. This shows that surface structure of lead silicate glasses changes： the content of PbO increases and the content of SiO2 decreases.