中文摘要：

在羟基化的单晶硅片上制备了3-巯丙基三甲氧基硅烷-稀土（MPTS-RE）复合薄膜。利用接触角测量仪、X射线光电子能谱仪（XPS）分析了MPTS-RE复合薄膜接触角及其表面典型化学元素的状态;运用原子力显微镜（AFM）观察了MPTS-RE复合薄膜的表面形貌并研究了其微摩擦学性能。结果表明：稀土成功组装到磺化后的MPTS薄膜表面;随着探针的滑动速率和载荷的增加,针尖与样品间摩擦力增加;硅基片和MPTS-RE复合薄膜表面的黏附力随着相对湿度的增加而增加;MPTS-RE复合薄膜具有较低的摩擦系数和黏附力。

英文摘要：

The composite film of MPTS-RE was prepared on single-crystal silicon substrate through a self-assembling process.Contact angle and the chemical composition of the film were analyzed by means of contact angle measurements and X-ray photo-electron spectroscopy（XPS）.Surface morphology and the tribological properties of the film were evaluated by atomic force microscope（AFM）.Results show that the rare earth（RE） is successfully deposited on sulfonated MPTS film.The friction force between the probe and the film increases with the increment of the scanning rate and the load.The adhesion force（ascends） with the increasing of relative humidity.MPTS-RE composite film has low steady friction coefficient and adhesion force.