中文摘要：

系统分析了电容成像（Electrical capacitance tomography，简称ECT）系统敏感分布和电势分布的关系，统一了计算公式，该方法简单且计算量小．仿真表明，采用该方法计算的ECT敏感分布，与采用定义计算的结果吻合。

英文摘要：

The relationship between the permittivity distribution and the measured capacitance in electrical capacitance tomography （ECT） is described by the sensitivity distribution which directly affects the image reconstruction. The sensitivity distribution is mainly computed according to its definition which is complicated and time-consuming. We analyze relationship between the sensitivity distribution and the electric potential distribution in ECT. The calculation formulae are pressented. The method is simple and fast. Simulation results show that the sensitivity distribution obtained by this method is consistent with that of the traditional method.