中文摘要：

介绍了均光波导多层存储器的基本结构和原理。波导多层存储器通过收集波导侧面信息符发出的散射光来读取数据，而均光波导多层存储器的设计主要是为了解决波导多层存储器侧面散射光强不均匀的问题。有一种方法就是通过改变信息符深度来实现均光。理论推导表明信息层表面的信息符深度沿着传导光传播方向逐渐增加时可以实现波导侧面散射光强的均匀分布，而且波导各个不同位置处信息符的深度值也可以通过拟合和计算得到。为了证明理论的正确性，设计了原理性实验，完成了原理性实验器件的研制。实验对均光波导多层存储器的结构、原理以及均光方法的可行性进行了验证。实验还将均光波导多层存储器的性能与一般的波导多层存储器作了对比，实验效果良好。

英文摘要：

The structure and principles of the uniform scattering waveguide multilayer memory are introduced. To read the information in the waveguide multilayer memory, an optoelectronic detector is used to detect the scattering beams emitted from the information dots on the waveguide surface. But the scattering light intensity distribution on the waveguide multilayer memory surface is not uniform which leads to low signal to noise ratio （SNR）. Uniform scattering waveguide multilayer memory can cover this defect by changing the information dots depths in each position. It has been proved that one of the methods to realize the uniform scattering is to change the depths of the information dots in each position. And a function about the depths distribution of information dots is deduced in the paper. Furthermore, experimental setup is designed to prove the feasibility of the theories above, An experimental storage device is fabricated and some good experimental results are demonstrated , including two photos contrasting the performance of the uniform scattering waveguide multilayer memory with that of the ordinary waveguide multilayer memory.