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A high voltage Bi-CMOS compatible buffer super-junction LDMOS with an N-type buried layer
  • ISSN号:1674-4926
  • 期刊名称:《半导体学报:英文版》
  • 时间:0
  • 分类:TN432[电子电信—微电子学与固体电子学] TN304.23[电子电信—物理电子学]
  • 作者机构:[1]State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology ofChina, Chengdu 610054, China
  • 相关基金:Project supported by the National Science and Technology Major Project of the Ministry of Science and Technology of China (No.2010ZX02201), the National Natural Science Foundation of China (No.61176069), and the National Defense Pre-Research of China (No.51308020304).
中文摘要:

A novel buffer super-junction(SJ) lateral double-diffused MOSFET(LDMOS) with an N-type buried layer(NB) is proposed. An N buffer layer is implemented under the SJ region and an N-type layer is buried in the P substrate. Firstly, the new electric field peak introduced by the p–n junction of the P substrate and the N-type buried layer modulates the surface electric field distribution. Secondly, the N buffer layer suppresses the substrate assisted depletion effect. Both of them improve the breakdown voltage(BV). Finally, because of the shallow depth of the SJ region, the NB buffer SJ-LDMOS is compatible with Bi-CMOS technology. Simulation results indicate that the average value of the surface lateral electric field strength of the NB buffer SJ-LDMOS reaches 23 V/ m at 15 m drift length which results in a BV of 350 V and a specific on-resistance of 21 m cm2.

英文摘要:

A novel buffer super-junction (S J) lateral double-diffused MOSFET (LDMOS) with an N-type buried layer (NB) is proposed. An N- buffer layer is implemented under the SJ region and an N-type layer is buried in the P substrate. Firstly, the new electric field peak introduced by the p-n junction of the P substrate and the N-type buried layer modulates the surface electric field distribution. Secondly, the N-buffer layer suppresses the substrate assisted depletion effect. Both of them improve the breakdown voltage (BV). Finally, because of the shallow depth of the SJ region, the NB buffer SJ-LDMOS is compatible with Bi-CMOS technology. Simulation results indicate that the average value of the surface lateral electric field strength of the NB buffer SJ-LDMOS reaches 23 V/μm at 15/μm drift length which results in a BV of 350 V and a specific on-resistance of 21 mΩ·cm2.

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期刊信息
  • 《半导体学报:英文版》
  • 中国科技核心期刊
  • 主管单位:中国科学院
  • 主办单位:中国电子学会 中国科学院半导体研究所
  • 主编:李树深
  • 地址:北京912信箱
  • 邮编:100083
  • 邮箱:cjs@semi.ac.cn
  • 电话:010-82304277
  • 国际标准刊号:ISSN:1674-4926
  • 国内统一刊号:ISSN:11-5781/TN
  • 邮发代号:2-184
  • 获奖情况:
  • 90年获中科院优秀期刊二等奖,92年获国家科委、中共中央宣传部和国家新闻出版署...,97年国家科委、中共中央中宣传部和国家新出版署三等奖,中国期刊方阵“双效”期刊
  • 国内外数据库收录:
  • 俄罗斯文摘杂志,美国化学文摘(网络版),荷兰文摘与引文数据库,美国工程索引,美国剑桥科学文摘,英国科学文摘数据库,日本日本科学技术振兴机构数据库,中国中国科技核心期刊,中国北大核心期刊(2004版),中国北大核心期刊(2008版),英国英国皇家化学学会文摘,中国北大核心期刊(2000版)
  • 被引量:7754