通过一种简单的共沉淀方法制备了Mn 掺杂二氧化锡(SnO2)颗粒, 对前驱体在不同温度下热处理, 并通过X 射线衍射(X-ray diffraction, XRD)和高分辨电子显微学(high-resolution transmission electron microscopy,HRTEM)对样品的微纳米结构进行了表征. 结果表明: 样品中除了四方相SnO2 外, 还存在正交相SnO2. XRD 测试结果显示, 随着退火温度的增加, 正交相SnO2 的峰强减弱, 四方相的峰强增加. HRTEM 分析表明: 样品中可以同时找到四方相和正交相SnO2的晶格像, 进一步证实了正交相SnO2的存在. Mn 掺杂SnO2 后, Mn 离子进入SnO2晶胞, 替代了Sn 离子, 因此引起晶格扭曲畸变, 对正交相SnO2的形成起着重要的作用.
Tin dioxide (SnO2) is an n-type semiconductor material with tetragonal rutile crystal structure under normal conditions and displays many interesting physical and chemical properties. Another form of SnO2 with an orthorhombic crystal structure is known to be stable only at high pressures and temperatures. However, there are limited reports on effects of Mn-doped tetragonal phase SnO2 on micro/nanostructured characteristics. In this article, micro/nanostructures of Mn-doped tetragonal phase SnO2 have been successfully prepared with a chemical co-precipitation method. The micro/nanostructural evolution of Mn-doped tetragonal phase SnO2 under different heat treatment temperatures is evaluated with X-ray diffraction (XRD) and a high-resolution transmission electron microscopy (HRTEM). It is surprisingly found that the orthorhombic phase SnO2 is formed in Mn-doped tetragonal phase SnO2 . The obvious diffraction peaks and clear lattice fringes confirm that the orthorhombic phase SnO2 nanocrystals evidently exist in Mn-doped SnO2 samples. Experimental results indicate that the XRD peak intensities and crystal planes of the orthorhombic phase SnO2 decrease with increasing of heat treatment temperatures. Formation of orthorhombic phase SnO2 is attributed to the lattice distortion of tetragonal phase SnO2 due to the Mn-doped tetragonal phase SnO2.