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Far-infrared properties of helium-doped silicon
  • ISSN号：0008-4204
  • 期刊名称：Canadian Journal of Physics
  • 时间：2015.8
  • 页码：935-940
  • 相关项目：通过温度效应探索研究超短脉冲强激光损伤机理
作者： Liu, Wei|Jiang, Yong|Xiang, Xia|Zu, Xiaotao|
同期刊论文项目
通过温度效应探索研究超短脉冲强激光损伤机理
期刊论文 33
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