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Role of Rare Earth Ions in Anodic Gate Dielectrics for Indium-Zinc-Oxide Thin-Film Transistors
  • ISSN号：0013-4651
  • 期刊名称：Journal of the Electrochemical Society
  • 时间：2012
  • 页码：H502-H506
  • 相关项目：金属氧化物薄膜晶体管稳定性机理的研究
作者： Xu, Hua|Li, Min|Wang, Lei|Peng, Junbiao|
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金属氧化物薄膜晶体管稳定性机理的研究
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