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Calibrating an Arbitrary Test Fixture for a Symmetric Device by Three Measurements
  • ISSN号：0018-9456
  • 期刊名称：IEEE Transactions on Instrumentation and Measureme
  • 时间：0
  • 页码：145-152
  • 语言：英文
  • 相关项目：基于封装的射频前端与天线的协同设计
作者： Han, Guorui|Zhang, Wenmei|Chen, Xinwei|Ma, Runbo|
同期刊论文项目
基于封装的射频前端与天线的协同设计
期刊论文 27 会议论文 10 获奖 3 专利 3
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