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Growth Stress in Bi Thin Films and Self-Formed Nanowires
  • ISSN号：1058-4587
  • 期刊名称：Integrated Ferroelectrics
  • 时间：0
  • 页码：82-88
  • 相关项目：应变硅/硅锗微细特征单元结构失稳及应变弛豫研究
作者： Ma, Fei|Ma, Ben|Xu, Ke-Wei|
同期刊论文项目
应变硅/硅锗微细特征单元结构失稳及应变弛豫研究
期刊论文 18
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