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X-ray photoelectron spectroscopy measurement of n-ZnO/p-NiO heterostructure valence-band offset
  • ISSN号：0003-6951
  • 期刊名称：Applied Physics Letters
  • 时间：0
  • 页码：554-560
  • 语言：英文
  • 相关项目：稳定、高效的p型ZnO薄膜的制备及器件研究
作者： Shen, D.Z.|Zhao, D.X.|Zhang, J.Y.|Zhang, Z.Z.|Shan, C.X.|Deng, R.|Zhao, Y.M.|Li, Y.F.|Fan, X.W.|Li, B.H.|Yao, B.|
同期刊论文项目
稳定、高效的p型ZnO薄膜的制备及器件研究
期刊论文 106 会议论文 7 专利 13
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