采用下降法生长技术,沿a向[1120]生长的掺碳钛宝石晶体,在切割等加工过程中掺碳钛宝石晶体经常发生定向开裂的现象.本文对掺碳钛宝石晶体的定向开裂特征和机理进行了分析与研究,发现定向裂纹是在基质氧化铝晶格的(1100)面上发源,并且沿着f00011晶向即c轴方向扩展.采用晶体结构可视化软件(Crystalmaker)模拟得出,基质氧化铝晶格原子在(1100)面上的原子排列最为稀疏,并且在(1100)晶面上,垂直[0001]晶向相邻原子间距最大,在应力作用下晶格(1100)[0001]系统的开裂强度最低.采用光学显微镜、扫描电镜(SEM)和电子探针等仪器和手段,发现在开裂的掺碳钛宝石晶体中沉积了不规则的碳包裹物,降温过程中包裹物的热膨胀失配引起巨大的内应力,使得裂纹在晶体最薄弱的系统(1100)[0001]面上发源并扩展,导致晶体的宏观定向开裂.该研究对优质钛宝石晶体的生长具有重要的理论和现实意义.
Directional cracking in Ti,C:sapphire crystals grown along [11 - 20] by Vertical Bridgman method often occurs in the cutting and processing process. In this work, we discuss the characteristic and mechanism of directional cracking of Ti,C:sapphire, and find that directional cracking originates from (-1100) lattice plane and spreads along [0001] orientation. Through the Crystalmaker Simulation software, we find that atomic arrangement on (-1100) lattice plane is the most sparse and adjacent atomic spacing is the largest along vertical [0001] direction, so in the system (-1100) [0001] of lattice has a minimum cracking strength, Irregular carbon inclusions in the cracked Ti,C:sapphire are observed with optical microscopy, scanning electron microscopy (SEM), and X-ray diffractometry. These inclusions cause great internal stress in the cooling process due to thermal expansion mismatch and cracking originating from and spreading in the weak system (1100) [0001] of lattice. As a consequence, macroscopic directional cracking is observed in the Ti,C:sapphire. The study has important theoretical and practical significance for growing high-quality Ti,C:sapphire crystal.