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中文摘要：
采用熔炼合金法制备DyPdSn样品，用切克劳斯基法把样品提拉成单晶，得到的单晶体横截面平滑而有光泽。根据 X-射线衍射结果，确定DyPdSn化合物为斜方晶系（Pnma）TiNiSi 型晶体结构；劳埃衍射斑点表明，该晶体为高质量单晶体。利用 X-射线照射单晶体的b＊面和c＊面，在（020）和（006）晶面上获得较强衍射，从而确定出DyPdSn单晶的晶面。
英文摘要：
The shows antiferromagnetic properties at low temperature.The polycrystalline ingots were prepared by arc-melting method.A single crystal was grown by using a Czochralski pulling method,the cross section of the single crystal is smooth and lustrous.The crystal structure were investigated by means of X-ray diffraction,DyPdSn compound crystalizes in the orthorhombic （Pnma）TiNiSi-type crystal struc-ture.X-ray Laue diffraction results show single crystal is high quality.The X-ray diffraction measurements were performed in the b＊ plane and c＊ plane,X-ray diffraction shows relatively strong reflections in （020） and （006）surfaces,which confirms growing direction of the DyPdSn single crystal.
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