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中文摘要：
提出了一种确定性的片上系统（SOC）测试调度算法．在对测试环采取最优分配和平衡优化的基础上，构造了包含4种序列对递增生成方法的循环迭代过程．该过程同时考虑测试访问机制的宽度、空隙面积、IP核测试面积等因素，可在较短的迭代步数得到有效的测试调度方案．对ITC’02基准电路进行了实验．结果表明，在得到近似解的前提下，该算法较传统的禁忌搜索和蚁群算法具有更快的运行速度．
英文摘要：
A deterministic algorithm is proposed for system-on-chip （SOC） test scheduling. Based on optimal assignment and balance design for test wrappers, four types of incremental sequence pair generation methods are constructed as a cyclic iteration process. By considering the test access mechanism （TAM） width, idle space, and test area for IP cores simultaneously, the algorithm can achieve effective solutions in certain iteration steps. Experimental results on ITC＇02 benchmark show that the proposed algorithm performs faster than the traditional tabu search （TS）and ant colony optimization （ACO） based methods while obtaining comparable results.
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同项目期刊论文
The Design-for-Testability Features and Test Implementation of a Giga Hertz General Purpose Micropro
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