针对现有全偏振测量与高光谱成像技术难以同步的核心问题,提出了一种新型双光路全偏振高光谱测量结构,利用基于电光效应的偏振调制技术与干涉成像技术,将目标光波的偏振信息、光谱信息和空间图像信息进行有效结合,实现了高光谱与全偏振成像的同步测量,极大丰富了目标探测能力和探测信息量。同时,利用计算机软件得到仿真结果验证了方法的正确性,并对可能产生的误差进行了分析。最后给出了部分实验结果和数据分析进一步验证其可行性。该研究对许多光学技术遥感领域,比如资源普查、环境检测、军事侦察等,具有重要意义。
Since full-polarization parameter measurement can not be well combined with hyperspectral imaging tech-nology yet,a new full-polarization hyperspectral imaging measurement structure using a dual optical path system is in-vestigated.Using the hyperspectral interference imaging technology and polarization modulation technology based on e-lectro-optic effect,the polarization information,spectral information and spatial image information are effectively com-bined,the synchronous measurement of hyperspectral information and full-polarization parameter is realized.The prin-ciple of the full-polarization parameter measurement is introduced at first.Then the experiment setup is shown and the optical elements are illustrated.Also,the detailed formula derivation steps of the full-Stokes vector is given.At last, some computer simulation data and experimental results are given.Through the combination of spectral imaging and full-polarization parameter measurement,the detecting information of the object is greatly enriched.The feasibility of this method is verified through simulation results.This work will definitely be helpful to many optical remote sensing technology areas such as resources survey,environmental monitoring and military reconnaissance.