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Stress analysis of electrostrictive material with an elliptic defect
  • 所属机构名称：上海交通大学
  • 成果类型：著作
  • 出版社：Science in China (Series G), 46:492-500,2003
  • 语言：英文
  • 相关项目：铁电智能材料的电致破坏与本构关系
作者： Jiang Quan|KUANG ZB|
同著作项目
铁电智能材料的电致破坏与本构关系
期刊论文 1 会议论文 2 著作 25
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