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Reliability analysis of a reparable multistate device attended by a repairman with single vacation
  • 所属机构名称：天津大学
  • 会议名称：30th Chinese Control Conference, CCC 2011
  • 成果类型：会议
  • 会场：Yantai, China
  • 相关项目：偏微分网络系统的控制
作者： Xu, Genqi|Ma, Lixia|
同会议论文项目
偏微分网络系统的控制
期刊论文 36 会议论文 16 著作 2
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