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An device case temperature closed-loop control system during burn-in test in Reliability
  • 所属机构名称：清华大学
  • 会议名称：Maintainability and Safety (ICRMS)，2011 9th International Conference on
  • 时间：2011
  • 成果类型：会议
  • 相关项目：植入电刺激对抗废用性骨丢失方法研究
作者： Qingfeng Li|Qingfeng Li|Shaobo Chen|Shaobo Chen|Weiming Wang|Weiming Wang|Luming Li|Luming Li|
同会议论文项目
植入电刺激对抗废用性骨丢失方法研究
期刊论文 5 会议论文 8 获奖 2
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