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Fatigue Test of Helical Nervous Electrodes and Weak Point Analysis of Helical Nervous Electrodes Des
  • 所属机构名称：清华大学
  • 会议名称：2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (E
  • 时间：2013
  • 成果类型：会议
  • 相关项目：植入电刺激对抗废用性骨丢失方法研究
作者： Yuan Yuan|Hongwei Hao|Xiongwei Wen|Xiaolong Mo|Luming Li|
同会议论文项目
植入电刺激对抗废用性骨丢失方法研究
期刊论文 5 会议论文 8 获奖 2
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