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The effect of flash power on the measurement of thermal effusivity using thermal wave imaging
  • 所属机构名称：首都师范大学
  • 会议名称：International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging
  • 成果类型：会议
  • 会场：Beijing, China
  • 相关项目：基于红外热波成像的表面下异性结构的识别研究
作者： Li, Yue|Tao, Ning|Feng, Lichun|Zhang, Cunlin|Zeng, Zhi|
同会议论文项目
基于红外热波成像的表面下异性结构的识别研究
期刊论文 9 会议论文 8
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