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Elimination of reflection induced artifacts in flash thermography
  • 所属机构名称：首都师范大学
  • 会议名称：Infrared, Millimeter Wave, and Terahertz Technologies
  • 成果类型：会议
  • 会场：Beijing, China
  • 相关项目：基于红外热波成像的表面下异性结构的识别研究
作者： Tao, Ning|Zou, Peng|Feng, Lichun|
同会议论文项目
基于红外热波成像的表面下异性结构的识别研究
期刊论文 9 会议论文 8
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