位置：成果数据库 > 会议 > 会议详情页
Efficient importance sampling for high-sigma yield analysis with adaptive online surrogate modeling
  • 所属机构名称：清华大学
  • 会议名称：16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013
  • 时间：2013
  • 成果类型：会议
  • 相关项目：CMOS毫米波电路基于自动建模的验证方法
作者： Yao, Jian|Ye, Zuochang|Wang, Yan|
同会议论文项目
CMOS毫米波电路基于自动建模的验证方法
期刊论文 11 会议论文 10
同项目会议论文
Modeling and Separate Extraction of Bias-Dependent and Bias-Independent S/D Resistances in MOSFETs
Fast Floating Random Walk Algorithm for Multi-Dielectric Capacitance Extraction with Numerical Chara
Time-Domain Segmentation based Massively Parallel Simulation for ADCs
A Fast Convolution Method and Its Application in Photomask Synthesis for Wafer Contour Fidelity Usin
Pmm: A Matlab toolbox for passive macromodeling in RF/mm-wave circuit design
Co-design of 60GHz wideband front-end IC with on-chip Tx/Rx switch based on passive macro-modeling
Tackling close-to-band passivity violations in passive macro-modeling
Modeling RF behavior of graphene up to 67GHz
An automatic parameter extraction and scalable modeling method for transformers in RF circuit