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Modeling and Separate Extraction of Bias-Dependent and Bias-Independent S/D Resistances in MOSFETs
  • 所属机构名称：清华大学
  • 会议名称：IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
  • 时间：2012
  • 成果类型：会议
  • 相关项目：CMOS毫米波电路基于自动建模的验证方法
作者： Guo, Zebang|Ye, Zuochang|Li, Xiaojian|Wang, Yan|
同会议论文项目
CMOS毫米波电路基于自动建模的验证方法
期刊论文 11 会议论文 10
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