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Analysis of noise of current accumulator in Time-Delay-Integration CMOS image sensor
  • 所属机构名称：天津大学
  • 会议名称：2011 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2011
  • 时间：2011
  • 成果类型：会议
  • 相关项目：90纳米以下高性能CMOS图像传感器关键技术研究
作者： 高岑|姚素英|徐江涛|高静|聂凯明|
同会议论文项目
90纳米以下高性能CMOS图像传感器关键技术研究
期刊论文 82 会议论文 12 专利 33
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