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Modeling Hot-Carrier-Induced Reliability of Poly-Silicon Thin Film Transistors
  • 所属机构名称：北京大学
  • 会议名称：IEEE EDSSC
  • 成果类型：会议
  • 相关项目：基于氧化锌薄膜晶体管的紫外图像传感器像素研究
作者： Lisa L. Wang|James B. Kuo|Shengdong Zhang|
同会议论文项目
基于氧化锌薄膜晶体管的紫外图像传感器像素研究
期刊论文 13 会议论文 31 专利 17
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