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Grain-Boundary Impact Ionization-Induced Current Hump Effects of Polysilicon TFTs
  • 所属机构名称：北京大学
  • 会议名称：in Proc. IEDMS
  • 成果类型：会议
  • 相关项目：基于氧化锌薄膜晶体管的紫外图像传感器像素研究
作者： T. C. Liu,J. B. Kuo,S.D.Zhang|
同会议论文项目
基于氧化锌薄膜晶体管的紫外图像传感器像素研究
期刊论文 13 会议论文 31 专利 17
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