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On Predicting the Maximum Circuit Aging
  • 所属机构名称：中国科学院计算技术研究所
  • 会议名称：IEEE Workshop on RTL and High Level Test (WRTLT)
  • 成果类型：会议
  • 相关项目：片上网络芯片中路由器电路和互连线的测试方法研究
作者： 李晓维|李华伟|韩银和|张磊|靳松|
同会议论文项目
片上网络芯片中路由器电路和互连线的测试方法研究
期刊论文 13 会议论文 22 专利 3
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