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Statistical reliability analysis under process variation and aging effects
  • 所属机构名称：复旦大学
  • 会议名称：2009 46th ACM/IEEE Design Automation Conference, DAC 2009
  • 成果类型：会议
  • 会场：San Francisco, CA
  • 相关项目：工艺偏差下的大规模互连线电路与非线性电路分析方法研究
作者： Hai, Zhou|Hengliang, Zhu|Fan, Yang|Xuan, Zeng|Li, Shang|Yinghai, Lu|
同会议论文项目
工艺偏差下的大规模互连线电路与非线性电路分析方法研究
期刊论文 21 会议论文 13 获奖 14 专利 3
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