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Functional test generation guided by steady-state probabilities of abstract design
  • 所属机构名称：中国科学院计算技术研究所
  • 会议名称：17th Design, Automation and Test in Europe, DATE 2014
  • 时间：2014
  • 成果类型：会议
  • 相关项目：考虑集成电路时延变异性的硅后定时验证方法
同会议论文项目
考虑集成电路时延变异性的硅后定时验证方法
期刊论文 19 会议论文 14
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