欢迎您!
东篱公司
退出
申报数据库
申报指南
立项数据库
成果数据库
期刊论文
会议论文
著 作
专 利
项目获奖数据库
位置:
成果数据库
>
会议
> 会议详情页
Time-domain modulated free-carrier absorption measurements of recombination process in silicon wafer
所属机构名称:中国科学院光电技术研究所
会议名称:14th International Conference on Photoacoustic and Photothermal Phenomena (ICPPP14)
成果类型:会议
会场:Cairo
相关项目:半导体材料特性的光学检测技术研究
作者:
Xiren Zhang|Chunming Gao|Bincheng Li|
同会议论文项目
半导体材料特性的光学检测技术研究
期刊论文 11
会议论文 8
专利 3
同项目会议论文
Analysis of free carrier absorption measurement of electronic transport properties of silicon wafers
Nondestructive implantation dose determination of annealed semiconductor by infrared ellipsometry
Semi-infinite photocarrier radiometric model for the characterization of semiconductor wafer
Influence of probe beam size on signal analysis of modulated free carrier absorption technique
Ion implantation dose dependence of photocarrier radiometry for thermally annealed silicon wafers
Accurate determination of electronic transport properties of semiconductor wafers with spatially res
Analysis of modulated free-carrier absorption measurement of electronic transport properties of sili